Swathi Miskin

Swathi Miskin

G Pulla Reddy Dental College and Hospital, Kurnool, Andhra Pradesh, India

Profile ID RP-000-0905 Joined 2023-01-17 1 article
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Authors: Swathi Miskin, Chandrasekhar Manduru, Nagalakshmi Reddy Sampathi, Upendranatha Reddy Nagireddy, Sujayeendranatha Reddy E, Sushma Chandra

DOI: 10.18231/j.idjsr.2022.012  

Volume10

Issue2

Pages53-59

Abstract

Aim: The aim of the present study is to evaluatepost thermocycling microleakage scores in class II cavities restored with Tetetric n ceram (TC) by, Bulk fill technique, Incremental technique, Centripetal techniques, followed by polymerization light source QTH and LED. Materials and Methods: Class II Conventional Mesioocclusal (MO) cavities were prepared with occlusal gingival depth 1mm above the CEJ. The final preparation has the following dimensions, 3 mm – buccolingual extension1.5 mm –axial dept hand 4 mm –occluso-cervical extension. The samples will be etched and rinsed, and then the universal matrix will be placed after that the bonding agent will be applied and curedLater all specimens were randomly divided into three groups, each containing 20 teeth.GROUP I-Bulk Technique, GROUPII- Incremental Technique with oblique laying GROUP III-Specimens were stored in distilled water at 37C till it is subjected to thermocycling. Sthermo cycled for 500 cycles at with temperature range of 5 to 55 degrees with 20 seconds dwell time. Specimens were sectioned along the long axis in the mesiodistal direction of the restoration with a diamond disc and analyzed using a stereo microscope at 10x magnification by an independent examiner who was blinded by the groups. Statistical analysis: Comparison of three groups with microleakage scores at gingival margins by Kruskal Wallis one-way ANOVA test. Pair-wise comparison of all groups with respect to microleakage scores at gingival margins by Mann-Whitney U test. Statistical analysis was performed using SPSS STATISTICS 21.0 software. Results: Among the three experimental groups least microleakage was seen with subgroup IIA (IN-QTH) followed by subgroup IIIA (CE-QTH) followed by subgroup IA (B-QTH). Among all these groups and subgroups, the least microleakage is seen in IN-LED (subgroup IIB), highest microleakage is seen in B-QTH (subgroup IA), interestingly there is no statistical difference between IN-QTH (subgroup IIA) and CE-LED (sub group IIIB).   Keywords: Incremental technique, Bulk technique, centripetal technique, Light­emitting diode (LED), Quartz tungsten halogen

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